Influence of refraction to the accuracy of a solution for the 2D-emission tomography problem

Influence of refraction to the accuracy of a solution for the 2D-emission tomography problem Full article

Journal

Journal of Inverse and Ill-Posed Problems
ISSN: 0928-0219 , E-ISSN: 1569-3945

Output data

Year: 2000, Volume: 8, Number: 2, Pages: 161-191 Pages count : 31 DOI: 10.1515/jiip.2000.8.2.161

Authors

Derevtsov E.Yu. ¹ , Dietz R. ² , Louis A.K. ² , Schuster T. ²

Affiliations

1	Sobolev Institute of Mathematics, Siberian Branch of Russian Academy of Sciences, Acad. Koptyug prosp. 4, 630090 Novosibirsk, Russian Federation
2	Fachbereich Mathematik, Universitat des Saarlandes, Geb. 36, 66041 Saarbrücken, Germany

Derevtsov E.Y. , Dietz R. , Louis A.K. , Schuster T.
Influence of refraction to the accuracy of a solution for the 2D-emission tomography problem
Journal of Inverse and Ill-Posed Problems. 2000. V.8. N2. P.161-191. DOI: 10.1515/jiip.2000.8.2.161 Scopus OpenAlex

Scopus:	2-s2.0-85007421150
OpenAlex:	W2324461723

DB	Citing
Scopus	14
OpenAlex	13