Influence of refraction to the accuracy of a solution for the 2D-emission tomography problem | Sciact - Система учета научной деятельности ИМ СО РАН

Influence of refraction to the accuracy of a solution for the 2D-emission tomography problem Научная публикация

Журнал

Journal of Inverse and Ill-Posed Problems
ISSN: 0928-0219 , E-ISSN: 1569-3945

Вых. Данные

Год: 2000, Том: 8, Номер: 2, Страницы: 161-191 Страниц : 31 DOI: 10.1515/jiip.2000.8.2.161

Авторы

Derevtsov E.Yu. ¹ , Dietz R. ² , Louis A.K. ² , Schuster T. ²

Организации

1	Sobolev Institute of Mathematics, Siberian Branch of Russian Academy of Sciences, Acad. Koptyug prosp. 4, 630090 Novosibirsk, Russian Federation
2	Fachbereich Mathematik, Universitat des Saarlandes, Geb. 36, 66041 Saarbrücken, Germany

Derevtsov E.Y. , Dietz R. , Louis A.K. , Schuster T.
Influence of refraction to the accuracy of a solution for the 2D-emission tomography problem
Journal of Inverse and Ill-Posed Problems. 2000. V.8. N2. P.161-191. DOI: 10.1515/jiip.2000.8.2.161 Scopus OpenAlex

Scopus:	2-s2.0-85007421150
OpenAlex:	W2324461723

БД	Цитирований
Scopus	14
OpenAlex	13