Feature Selection and Sample Self-Correction in Multiple Instance Learning with Weak Labeling - Conference attendances

Feature Selection and Sample Self-Correction in Multiple Instance Learning with Weak Labeling Conference attendances

Language

Английский

Participant type

Пленарный

Conference

XI International Scientific Conference "Computer Science and Applied Mathematics"
07-11 Oct 2026 , Алматы

Authors

Berikov V.B. ¹ , Kutnenko O.A. ¹

Affiliations

1	Sobolev Institute of Mathematics, Siberian Branch of Russian Academy of Sciences, Novosibirsk, 630090, Russia

Berikov V.B. , Kutnenko O.A.
Feature Selection and Sample Self-Correction in Multiple Instance Learning with Weak Labeling
XI International Scientific Conference "Computer Science and Applied Mathematics" 07-11 Oct 2026