Feature Selection and Sample Self-Correction in Multiple Instance Learning with Weak Labeling - Доклады на конференциях | Sciact - Система учета научной деятельности ИМ СО РАН

Feature Selection and Sample Self-Correction in Multiple Instance Learning with Weak Labeling Доклады на конференциях

Язык

Английский

Тип доклада

Пленарный

Конференция

XI International Scientific Conference "Computer Science and Applied Mathematics"
07-11 окт. 2026 , Алматы

Авторы

Berikov V.B. ¹ , Kutnenko O.A. ¹

Организации

1	Институт математики им. С.Л. Соболева СО РАН

Berikov V.B. , Kutnenko O.A.
Feature Selection and Sample Self-Correction in Multiple Instance Learning with Weak Labeling
XI International Scientific Conference "Computer Science and Applied Mathematics" 07-11 Oct 2026